#7692. A unified OLED aging model combining three modeling approaches for extending AMOLED lifetime

October 2026publication date
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Journal’s subject area:
Electrical and Electronic Engineering;
Materials Science (all);
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Abstract:
Aging is still the most challenging issue for organic light-emitting diodes (OLEDs), which causes the image-sticking artifacts on active-matrix organic light-emitting diode (AMOLED) displays and limits their lifetime. To overcome this demerit, an aging model is necessary to compensate for aging artifacts. In this paper, we present a unified OLED aging model, which combines three feasible modeling approaches of OLED degradation, namely, data-counting, electro-optical, and correlation methods.
Keywords:
aging compensation; aging model; AMOLED; correlation; data counting; electro-optical; image sticking; lifetime; OLED degradation

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