#7614. High contrast imaging of dental fluorosis in the short wavelength infrared

October 2026publication date
Proposal available till 23-05-2025
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Journal’s subject area:
Engineering (all);
Physics and Astronomy (all);
Biochemistry, Genetics and Molecular Biology (all);
Chemistry (all);
Materials Science (all);
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Abstract:
Dental fluorosis is an increasing problem due to over exposure to fluoride from the environment. Fluorosis causes hypomineralization of the enamel during tooth development and mild fluorosis is visible as faint white lines on the tooth surface while the most severe fluorosis can result in pitted surfaces. It is difficult to quantify the severity of mild to moderate fluorosis and assessments are limited to subjective visual examinations. Dental fluorosis appears with very high contrast at short wavelength infrared (SWIR) wavelengths beyond 1400 nm and we hypothesize that these wavelengths may be better suited for detecting mild fluorosis and for estimating the severity on tooth surfaces. In this study, the contrast of fluorosis of varying severity on extracted human permanent teeth was measured at SWIR wavelengths ranging from 1300 to 2150 nm using an extended range of InGaAs camera and broadband light sources.
Keywords:
dental fluorosis; optical coherence tomography; short-wavelength infrared imaging

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