#7422. A case study on accelerated light- and elevated temperature-induced degradation testing of commercial multi-crystalline silicon passivated emitter and rear cell modules

October 2026publication date
Proposal available till 17-05-2025
4 total number of authors per manuscript0 $

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Journal’s subject area:
Electrical and Electronic Engineering;
Condensed Matter Physics;
Electronic, Optical and Magnetic Materials;
Renewable Energy, Sustainability and the Environment;
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Abstract:
Light- and elevated temperature-induced degradation (LeTID) can have significant and long-lasting effects on silicon photovoltaic modules. Its behaviour is complex, showing highly variable degradation under different conditions or due to minor changes in device fabrication. Here, we show the large difference in LeTID kinetics and extents in multi-crystalline passivated emitter and rear cell (multi-PERC) modules from four different manufacturers.
Keywords:
degradation; LeTID; light- and elevated temperature-induced degradation; multi-PERC; PV modules; silicon solar cells

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